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Optical metrology : proceedings of a conference held 18-19 July, 1999, Denver, Colorado / Ghanim A. Al-Jumaily, editor ; sponsored by SPIE - The International Society for Optical Engineering.
Contributor(s): Al-Jumaily, Ghanim A
| Society of Photo-optical Instrumentation Engineers.
Material type: 
BookSeries: Critical reviews of optical science and technology.Publisher: Bellingham, Washington : SPIE Optical Engineering Press, 1999Description: vi, 276 p. : ill. ; 24 cm.ISBN: 0819432350.Subject(s): Optical measurements -- CongressesDDC classification: 681.25
| Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| General lending | MTU Bishopstown Library Lending | 681.25 (Browse shelf(Opens below)) | 1 | Available | 00085284 |
Total holds: 0
Enhanced descriptions from Syndetics:
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
Includes bibliographical references.