Hot carrier reliability of lateral DMOS transistors in power process applications / author Vicky O'Donovan -- submitted for the degree of Master of Engineering at the Institute of Technology, Tralee, Co. Kerry, Ireland.
By: O'Donovan, Vicky [dis].
Material type:
BookPublisher: 2003Description: viii, 132p., XXII : ill. ; 30 cm. + hbk.Subject(s): Metal oxide semiconductor field-effect transistors
| Metal oxide semiconductor field-effect transistors -- Engineering | Transistors -- Power process applicationsDDC classification: 621.3815284 Online resources: Access eThesis Dissertation note: MEng -- August, 2001 at Institute of Technology Tralee.
| Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| 2 hour loan | MTU Kerry North Campus Library Theses | MEng 2 (Browse shelf(Opens below)) | 1 | Available | 38888000408942 |
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MEng -- August, 2001 at Institute of Technology Tralee.
Includes bibliographical and website references (p. 120-132)
Tralee : Institute of Technology Tralee, 2003. 30 cm.
s 2003 ie n r