Investigation into the correct statistical distribution for oxide breakdown versus the oxide thickness used in integrated circuit manufacture. / by Eoin James O'Driscoll : a thesis submittted in fulfilment of HETAC requirements for award of the Degree of Master of Engineering (MEng) [at] Institute of Technology, Tralee, Co. Kerry, Ireland.
By: O'Driscoll, Eoin James [dis].
Material type:
BookPublisher: 2004Description: 104p. (with appendices) : ill. ; 30 cm. + hbk.Subject(s): Integrated circuits
| Lifetime data -- Statistical methods | Failure time data analysis | Reliability (Engineering) | Plant maintenance -- Electronic engineeringDDC classification: 621.381548 Dissertation note: MEng -- June, 2004 at College of Engineering, Institute of Technology Tralee.
| Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| 2 hour loan | MTU Kerry North Campus Library Theses | MEng 3 (Browse shelf(Opens below)) | 1 | Available | 38888000406466 |
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MEng -- June, 2004 at College of Engineering, Institute of Technology Tralee.
with [7] p. of bibliographical details.
Tralee : Institute of Technology Tralee, 2004. 30 cm.
s 2004 ie n r