Nanoscale charactersation of surfaces and interfaces / N. John DiNardo.
By: DiNardo, N. John
.
Material type: 
BookPublisher: Germany : VCH Weinheim, 1994Description: 163 p. : ill. ; 25 cm. + hbk.ISBN: 3527292470.Subject(s): Scanning tunneling microscopyDDC classification: 502.82 | Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| General lending | MTU Bishopstown Library Lending | 502.82 (Browse shelf(Opens below)) | 1 | Available | 00070217 |
Enhanced descriptions from Syndetics:
Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them.
Topics include:
Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale
Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of information
Includes bibliographical references (pages 151-158) and index.
Introduction -- Scanning tunneling microscopy (STM) -- Atomic force microscopy -- Manipulation of atoms and atom clusters on the nanoscale -- Spin-offs of STM non-contact nanoscale probes.
Table of contents provided by Syndetics
- Scanning Tunneling Microscopy (STM)
- Atomic Force Microscopy
- Manipulation of Atoms and Atom Clusters on the Nanoscale
- Spin-offs of STM: Non-Contact Nanoscale Probes