MTU Library Catalogue

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In situ scanning electron microscopy in materials research / edited by Klaus Wetzig and Dietrich Schulze.

Contributor(s): Wetzig, Klaus | Schultze, Dietrich, 1934-.
Material type: materialTypeLabelBookPublisher: Berlin : Akademie Verlag, 1995Description: 243 p. : ill ; 25 cm.ISBN: 3055013050.Subject(s): Scanning electron microscopyDDC classification: 502.8
Contents:
Introduction -- Fundamentals of SEM/method and equipment -- Mechanical loading experiments -- Special equipments for mechanical loading -- Thermal experiments -- Electrical and magnetic experiments -- Excess carrier experiments on semiconductors -- Laser irradiation experiments -- Ion bombardment experiments -- Fundamentals and applications of environmental scanning electron microscopy.
Holdings
Item type Current library Call number Copy number Status Barcode
General lending MTU Bishopstown Library Lending 502.8 (Browse shelf(Opens below)) 1 Available 00018059
Total holds: 0

Enhanced descriptions from Syndetics:

The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.

Includes bibliographical references and index.

Introduction -- Fundamentals of SEM/method and equipment -- Mechanical loading experiments -- Special equipments for mechanical loading -- Thermal experiments -- Electrical and magnetic experiments -- Excess carrier experiments on semiconductors -- Laser irradiation experiments -- Ion bombardment experiments -- Fundamentals and applications of environmental scanning electron microscopy.