Enhanced descriptions from Syndetics:

Measurement Systems: Application and Design provides a breadth/depth of coverage not found elsewhere. This allows easy selection of topics to meet local needs for beginning or advanced courses, and continued value for industrial practice. It treats measurement science and technology as an important field in its own right, starting with basic principles, applying them to sensors for physical variables, and completing the measurement chain with signal conditioning and data acquisition/processing hardware and software. Carefully selected references and websites lead the interested reader to resources beyond the scope of the text. Descriptive material is buttressed with detailed analysis/design information. Helpful software (statistics, dynamic simulation, data acquisition/processing) is integrated throughout. Book jacket.

Table of contents provided by Syndetics

• Preface (p. xiv)
• About the Author (p. v)
• Part 1 General Concepts (p. 1)
• Chapter 1 Types of Applications of Measurement Instrumentation (p. 3)
• 1.1 Why Study Measurement Systems? (p. 3)
• 1.2 Classification of Types of Measurement Applications (p. 5)
• 1.3 Computer-Aided Machines and Processes (p. 7)
• 1.4 Conclusion (p. 9)
• Problems (p. 10)
• Bibliography (p. 11)
• Chapter 2 Generalized Configurations and Functional Descriptions of Measuring Instruments (p. 13)
• 2.1 Functional Elements of an Instrument (p. 13)
• 2.2 Active and Passive Transducers (p. 18)
• 2.3 Analog and Digital Modes of Operation (p. 19)
• 2.4 Null and Deflection Methods (p. 21)
• 2.5 Input-Output Configuration of Instruments and Measurement Systems (p. 22)
• Methods of Correction for Interfering and Modifying Inputs (p. 26)
• 2.6 Conclusion (p. 38)
• Problems (p. 39)
• Chapter 3 Generalized Performance Characteristics of Instruments (p. 40)
• 3.1 Introduction (p. 40)
• 3.2 Static Characteristics and Static Calibration (p. 41)
• Meaning of Static Calibration (p. 41)
• Measured Value versus True Value (p. 43)
• Some Basic Statistics (p. 45)
• Least-Squares Calibration Curves (p. 54)
• Calibration Accuracy versus Installed Accuracy (p. 61)
• Combination of Component Errors in Overall System-Accuracy Calculations (p. 67)
• Theory Validation by Experimental Testing (p. 72)
• Effect of Measurement Error on Quality-Control Decisions in Manufacturing (p. 74)
• Static Sensitivity (p. 76)
• Computer-Aided Calibration and Measurement: Multiple Regression (p. 78)
• Linearity (p. 85)
• Threshold, Noise Floor, Resolution, Hysteresis, and Dead Space (p. 86)
• Scale Readability (p. 91)
• Span (p. 91)
• Generalized Static Stiffness and Input Impedance: Loading Effects (p. 91)
• Concluding Remarks on Static Characteristics (p. 103)
• 3.3 Dynamic Characteristics (p. 103)
• Generalized Mathematical Model of Measurement System (p. 103)
• Digital Simulation Methods for Dynamic Response Analysis (p. 106)
• Operational Transfer Function (p. 106)
• Sinusoidal Transfer Function (p. 107)
• Zero-Order Instrument (p. 109)
• First-Order Instrument (p. 111)
• Step Response of First-Order Instruments (p. 114)
• Ramp Response of First-Order Instruments (p. 121)
• Frequency Response of First-Order Instruments (p. 123)
• Impulse Response of First-Order Instruments (p. 128)
• Second-Order Instrument (p. 131)
• Step Response of Second-Order Instruments (p. 133)
• Terminated-Ramp Response of Second-Order Instruments (p. 135)
• Ramp Response of Second-Order Instruments (p. 137)
• Frequency Response of Second-Order Instruments (p. 137)
• Impulse Response of Second-Order Instruments (p. 139)
• Dead-Time Elements (p. 141)
• Logarithmic Plotting of Frequency-Response Curves (p. 143)
• Response of a General Form of Instrument to a Periodic Input (p. 149)
• Response of a General Form of Instrument to a Transient Input (p. 157)
• Frequency Spectra of Amplitude-Modulated Signals (p. 167)
• Characteristics of Random Signals (p. 178)
• Requirements on Instrument Transfer Function to Ensure Accurate Measurement (p. 194)
• Sensor Selection Using Computer Simulation (p. 200)
• Numerical Correction of Dynamic Data (p. 202)
• Experimental Determination of Measurement-System Parameters (p. 206)
• Loading Effects under Dynamic Conditions (p. 211)
• Problems (p. 214)
• Bibliography (p. 221)
• Part 2 Measuring Devices (p. 223)
• Chapter 4 Motion and Dimensional Measurement (p. 225)
• 4.1 Introduction (p. 225)
• 4.2 Fundamental Standards (p. 225)
• 4.3 Relative Displacement: Translational and Rotational (p. 228)
• Calibration (p. 228)
• Resistive Potentiometers (p. 231)
• Resistance Strain Gage (p. 240)
• Differential Transformers (p. 252)
• Synchros and Resolvers (p. 262)
• Variable-Inductance and Variable-Reluctance Pickups (p. 267)
• Eddy-Current Noncontacting Transducers (p. 271)
• Capacitance Pickups (p. 273)
• Piezoelectric Transducers (p. 284)
• Electro-Optical Devices (p. 292)
• Photographic and Electronic-Imaging Techniques (p. 312)
• Photoelastic, Brittle-Coating, and Moire Fringe Stress-Analysis Techniques (p. 319)
• Displacement-to-Pressure (Nozzle-Flapper) Transducer (p. 321)
• Digital Displacement Transducers (Translational and Rotary Encoders) (p. 327)
• Ultrasonic Transducers (p. 335)
• 4.4 Relative Velocity: Translational and Rotational (p. 337)
• Calibration (p. 337)
• Velocity by Electrical Differentiation of Displacement Voltage Signals (p. 339)
• Average Velocity from Measured [Delta]x and [Delta]t (p. 339)
• Mechanical Flyball Angular-Velocity Sensor (p. 342)
• Mechanical Revolution Counters and Timers (p. 342)
• Tachometer Encoder Methods (p. 343)
• Laser-Based Methods (p. 344)
• Radar (Microwave) Speed Sensors (p. 345)
• Stroboscopic Methods (p. 346)
• Translational-Velocity Transducers (Moving-Coil and Moving-Magnet Pickups) (p. 347)
• DC Tachometer Generators for Rotary-Velocity Measurement (p. 348)
• AC Tachometer Generators for Rotary-Velocity Measurement (p. 349)
• Eddy-Current Drag-Cup Tachometer (p. 349)
• 4.5 Relative-Acceleration Measurements (p. 351)
• 4.6 Seismic- (Absolute-) Displacement Pickups (p. 351)
• 4.7 Seismic- (Absolute-) Velocity Pickups (p. 356)
• 4.8 Seismic- (Absolute-) Acceleration Pickups (Accelerometers) (p. 357)
• Deflection-Type Accelerometers (p. 358)
• Null-Balance- (Servo-) Type Accelerometers (p. 369)
• Accelerometers for Inertial Navigation (p. 372)
• Mechanical Loading of Accelerometers on the Test Object (p. 373)
• Laser Doppler Vibrometers (p. 373)
• 4.9 Calibration of Vibration Pickups (p. 375)
• 4.10 Jerk Pickups (p. 378)
• 4.11 Pendulous (Gravity-Referenced) Angular-Displacement Sensors (p. 379)
• 4.12 Gyroscopic (Absolute) Angular-Displacement and Velocity Sensors (p. 383)
• 4.13 Coordinate-Measuring Machines (p. 398)
• 4.14 Surface-Finish Measurement (p. 406)
• 4.15 Machine Vision (p. 413)
• 4.16 The Global-Positioning System (GPS) (p. 421)
• Problems (p. 423)
• Bibliography (p. 431)
• Chapter 5 Force, Torque, and Shaft Power Measurement (p. 432)
• 5.1 Standards and Calibration (p. 432)
• 5.2 Basic Methods of Force Measurement (p. 434)
• 5.3 Characteristics of Elastic Force Transducers (p. 441)
• Bonded-Strain-Gage Transducers (p. 446)
• Differential-Transformer Transducers (p. 452)
• Piezoelectric Transducers (p. 452)
• Variable-Reluctance/FM-Oscillator Digital Systems (p. 455)
• Loading Effects (p. 456)
• 5.4 Resolution of Vector Forces and Moments into Rectangular Components (p. 457)
• 5.5 Torque Measurement on Rotating Shafts (p. 464)
• 5.6 Shaft Power Measurement (Dynamometers) (p. 470)
• 5.7 Gyroscopic Force and Torque Measurement (p. 474)
• 5.8 Vibrating-Wire Force Transducers (p. 474)
• Problems (p. 476)
• Bibliography (p. 480)
• Chapter 6 Pressure and Sound Measurement (p. 481)
• 6.1 Standards and Calibration (p. 481)
• 6.2 Basic Methods of Pressure Measurement (p. 482)
• 6.3 Deadweight Gages and Manometers (p. 482)
• Manometer Dynamics (p. 490)
• 6.4 Elastic Transducers (p. 500)
• 6.5 Vibrating-Cylinder and Other Resonant Transducers (p. 515)
• 6.6 Dynamic Effects of Volumes and Connecting Tubing (p. 517)
• Liquid Systems Heavily Damped, and Slow-Acting (p. 518)
• Liquid Systems Moderately Damped, and Fast-Acting (p. 520)
• Gas Systems with Tube Volume a Small Fraction of Chamber Volume (p. 524)
• Gas Systems with Tube Volume Comparable to Chamber Volume (p. 526)
• The Infinite Line-Pressure Probe (p. 527)
• Conclusion (p. 528)
• 6.7 Dynamic Testing of Pressure-Measuring Systems (p. 528)
• 6.8 High-Pressure Measurement (p. 535)
• 6.9 Low-Pressure (Vacuum) Measurement (p. 536)
• Diaphragm Gages (p. 536)
• McLeod Gage (p. 538)
• Knudsen Gage (p. 540)
• Momentum-Transfer (Viscosity) Gages (p. 541)
• Thermal-Conductivity Gages (p. 541)
• Ionization Gages (p. 545)
• Dual-Gage Technique (p. 547)
• 6.10 Sound Measurement (p. 547)
• Sound-Level Meter (p. 548)
• Microphones (p. 551)
• Pressure Response of a Capacitor Microphone (p. 554)
• Acoustic Intensity (p. 565)
• Acoustic Emission (p. 568)
• 6.11 Pressure-Signal Multiplexing Systems (p. 569)
• 6.12 Special Topics (p. 571)
• Pressure Distribution (p. 571)
• Overpressure Protection for Gages and Transducers (p. 573)
• Problems (p. 574)
• Bibliography (p. 576)
• Chapter 7 Flow Measurement (p. 578)
• 7.1 Local Flow Velocity, Magnitude and Direction (p. 578)
• Flow Visualization (p. 578)
• Velocity Magnitude from Pitot-Static Tube (p. 582)
• Velocity Direction from Yaw Tube, Pivoted Vane, and Servoed Sphere (p. 590)
• Dynamic Wind-Vector Indicator (p. 594)
• Hot-Wire and Hot-Film Anemometers (p. 596)
• Hot-Film Shock-Tube Velocity Sensors (p. 611)
• Laser Doppler Anemometer (p. 611)
• 7.2 Gross Volume Flow Rate (p. 615)
• Calibration and Standards (p. 616)
• Constant-Area, Variable-Pressure-Drop Meters ("Obstruction" Meters) (p. 620)
• Averaging Pitot Tubes (p. 632)
• Constant-Pressure-Drop, Variable-Area Meters (Rotameters) (p. 633)
• Turbine Meters (p. 635)
• Positive-Displacement Meters (p. 640)
• Metering Pumps (p. 642)
• Electromagnetic Flowmeters (p. 643)
• Drag-Force Flowmeters (p. 648)
• Ultrasonic Flowmeters (p. 649)
• Vortex-Shedding Flowmeters (p. 655)
• Miscellaneous Topics (p. 657)
• 7.2 Gross Mass Flow Rate (p. 660)
• Volume Flowmeter Plus Density Measurement (p. 660)
• Direct Mass Flowmeters (p. 664)
• Problems (p. 672)
• Bibliography (p. 675)
• Chapter 8 Temperature and Heat-Flux Measurement (p. 677)
• 8.1 Standards and Calibration (p. 677)
• 8.2 Thermal-Expansion Methods (p. 685)
• Bimetallic Thermometers (p. 685)
• Liquid-in-Glass Thermometers (p. 687)
• Pressure Thermometers (p. 688)
• 8.3 Thermoelectric Sensors (Thermocouples) (p. 691)
• Common Thermocouples (p. 699)
• Reference-Junction Considerations (p. 701)
• Special Materials, Configurations, and Techniques (p. 704)
• 8.4 Electrical-Resistance Sensors (p. 713)
• Conductive Sensors (Resistance Thermometers) (p. 713)
• Bulk Semiconductor Sensors (Thermistors) (p. 719)
• 8.5 Junction Semiconductor Sensors (p. 723)
• 8.6 Digital Thermometers (p. 727)
• 8.7 Radiation Methods (p. 727)
• Radiation Fundamentals (p. 728)
• Radiation Detectors: Thermal and Photon (p. 734)
• Unchopped (DC) Broadband Radiation Thermometers (p. 746)
• Chopped (AC) Broadband Radiation Thermometers (p. 750)
• Chopped (AC) Selective-Band (Photon) Radiation Thermometers (p. 752)
• Automatic Null-Balance Radiation Thermometers (p. 756)
• Monochromatic-Brightness Radiation Thermometers (Optical Pyrometers) (p. 758)
• Two-Color Radiation Thermometers (p. 760)
• Blackbody-Tipped Fiber-Optic Radiation Thermometer (p. 760)
• Fluoroptic Temperature Measurement (p. 763)
• Infrared Imaging Systems (p. 764)
• 8.8 Temperature-Measuring Problems in Flowing Fluids (p. 767)
• Conduction Error (p. 767)
• Radiation Error (p. 770)
• Velocity Effects (p. 774)
• 8.9 Dynamic Response of Temperature Sensors (p. 777)
• Dynamic Compensation of Temperature Sensors (p. 781)
• 8.10 Heat-Flux Sensors (p. 782)
• Slug-Type (Calorimeter) Sensors (p. 782)
• Steady-State or Asymptotic Sensors (Gardon Gage) (p. 786)
• Application Considerations (p. 788)
• Problems (p. 789)
• Bibliography (p. 791)
• Chapter 9 Miscellaneous Measurements (p. 792)
• 9.1 Time, Frequency, and Phase-Angle Measurement (p. 792)
• 9.2 Liquid Level (p. 799)
• 9.3 Humidity (p. 806)
• 9.4 Chemical Composition (p. 809)
• 9.5 Current and Power Measurement (p. 810)
• 9.6 Using "Observers" to Measure Inaccessible Variables in a Physical System (p. 814)
• 9.7 Sensor Fusion (Complementary Filtering) (p. 826)
• Absolute Angle Measurement (p. 829)
• Problems (p. 833)
• Bibliography (p. 834)
• Part 3 Manipulation, Transmission, and Recording of Data (p. 835)
• Chapter 10 Manipulating, Computing, and Compensating Devices (p. 837)
• 10.1 Bridge Circuits (p. 837)
• 10.2 Amplifiers (p. 843)
• Operational Amplifiers (p. 844)
• Instrumentation Amplifiers (p. 851)
• Transconductance and Transimpedance Amplifiers (p. 853)
• Noise Problems, Shielding, and Grounding (p. 855)
• Chopper, Chopper-Stabilized, and Carrier Amplifiers (p. 858)
• Charge Amplifiers and Impedance Converters (p. 860)
• Concluding Remarks (p. 863)
• 10.3 Filters (p. 864)
• Low-Pass Filters (p. 864)
• High-Pass Filters (p. 870)
• Bandpass Filters (p. 870)
• Band-Rejection Filters (p. 870)
• Digital Filters (p. 872)
• A Hydraulic Bandpass Filter for an Oceanographic Transducer (p. 875)
• Mechanical Filters for Accelerometers (p. 876)
• Filtering by Statistical Averaging (p. 879)
• 10.4 Integration and Differentiation (p. 879)
• Integration (p. 879)
• Differentiation (p. 881)
• 10.5 Dynamic Compensation (p. 889)
• 10.6 Positioning Systems (p. 894)
• 10.7 Addition and Subtraction (p. 904)
• 10.8 Multiplication and Division (p. 904)
• 10.9 Function Generation and Linearization (p. 907)
• 10.10 Amplitude Modulation and Demodulation (p. 912)
• 10.11 Voltage-to-Frequency and Frequency-to-Voltage Converters (p. 913)
• 10.12 Analog-to-Digital and Digital-to-Analog Converters; Sample/Hold Amplifiers (p. 913)
• 10.13 Signal and System Analyzers (Spectrum Analyzers) (p. 923)
• Problems (p. 927)
• Bibliography (p. 930)
• Chapter 11 Data Transmission and Instrument Connectivity (p. 931)
• 11.1 Cable Transmission of Analog Voltage and Current Signals (p. 931)
• 11.2 Cable Transmission of Digital Data (p. 935)
• 11.3 Fiber-Optic Data Transmission (p. 936)
• 11.4 Radio Telemetry (p. 937)
• 11.5 Pneumatic Transmission (p. 943)
• 11.6 Synchro Position Repeater Systems (p. 944)
• 11.7 Slip Rings and Rotary Transformers (p. 946)
• 11.8 Instrument Connectivity (p. 948)
• 11.9 Data Storage with Delayed Playback (An Alternative to Data Transmission) (p. 952)
• Problems (p. 952)
• Bibliography (p. 953)
• Chapter 12 Voltage-Indicating and -Recording Devices (p. 954)
• 12.1 Standards and Calibration (p. 954)
• 12.2 Analog Voltmeters and Potentiometers (p. 954)
• 12.3 Digital Voltmeters and Multimeters (p. 961)
• 12.4 Electromechanical Servotype XT and XY Recorders (p. 963)
• 12.5 Thermal-Array Recorders and Data Acquisition Systems (p. 968)
• 12.6 Analog and Digital Cathode-Ray Oscilloscopes/Displays and Liquid-Crystal Flat-Panel Displays (p. 968)
• 12.7 Virtual Instruments (p. 974)
• 12.8 Magnetic Tape and Disk Recorders/Reproducers (p. 974)
• Bibliography (p. 980)
• Chapter 13 Data-Acquisition Systems for Personal Computers (p. 981)
• 13.1 Essential Features of Data-Acquisition Boards (p. 982)
• 13.2 The DASYLAB Data-Acquisition and -Processing Software (p. 983)
• The DASYLAB Functional Modules (p. 984)
• List and Brief Description of the Functional Modules (p. 985)
• 13.3 DASYLAB Simulation Example Number One (p. 988)
• Simulating Sensor Signals and Recording Them versus Time (p. 988)
• Stopping an Experiment at a Selected Time (p. 991)
• Chart Recorder Options (p. 991)
• Producing Tables or Lists (p. 991)
• Analog and Digital Meters (p. 992)
• Some Simple Data-Processing Operations (p. 992)
• Integration and Differentiation (p. 993)
• 13.4 DASYLAB Simulation Example Number Two (p. 993)
• Running the Demonstration (p. 997)
• 13.5 DASYLAB Simulation Example Number Three (p. 1000)
• Running the Demonstration (p. 1003)
• 13.6 A Simple Real-World Experiment Using DASYLAB (p. 1005)
• Chapter 14 Measurement Systems Applied to Micro- and Nanotechnology (p. 1015)
• 14.1 Microscale Sensors (p. 1016)
• 14.2 Micro-Motion-Positioning Systems (p. 1019)
• 14.3 Particle Instruments and Clean-Room Technology (p. 1028)
• 14.4 Partial-Pressure Measurements in Vacuum Processes (p. 1038)
• 14.5 Magnetic Levitation Systems for Wafer Conveyors (p. 1048)
• 14.6 Scanning-Probe Microscopes (p. 1055)
• Bibliography (p. 1062)
• Index (p. 1063)

Author notes provided by Syndetics