Digital logic testing and simulation / Alexander Miczo.
By: Miczo, Alexander
.
Material type: 
BookPublisher: New York : John Wiley, 1987Description: xiv, 414 p. : ill. ; 24 cm.ISBN: 047161307X ; T4766.Subject(s): Digital electronicsDDC classification: 621.3815 | Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| General lending | MTU Bishopstown Library Lending | 621.3815 (Browse shelf(Opens below)) | 1 | Available | 00031337 | |
| General lending | MTU Bishopstown Library Lending | 621.3815 (Browse shelf(Opens below)) | 1 | Available | 00031338 |
Enhanced descriptions from Syndetics:
Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer.
Includes bibliographical references and index.
Introduction -- Combinational logic test -- Sequential logic test -- Simulation -- The automatic test pattern generator -- Automatic test equipment -- Design-for-test -- Memory system design and test -- Self-test and fault tolerance -- Functional test and other topics.