MTU Library Catalogue

Syndetics cover image
Image from Syndetics

Reliability statistics / Robert A. Dovich.

By: Dovich, Robert A, 1951-.
Material type: materialTypeLabelBookPublisher: Milwaukee, Wis. : ASQC Quality Press, c1990Description: xi, 93p. : ill. ; 26 cm.ISBN: 0873890868.Subject(s): Reliability (Engineering) -- Statistical methodsDDC classification: 620.00452
Contents:
Reliability definitions -- Availability -- Reliability bathtub curve -- Exponential distribution -- Estimating MTBF -- Censoring and MTBF calculations -- Reliability prediction -- Confidence intervals for MTBF -- System reliability -- Bayes' theorem application -- Beta distribution -- Nonparametric and related test designs -- Hazard function -- Wearout distribution -- Conditional probability of failures -- Weibull distribution -- Log-normal distribution -- Stress-strength interference -- Binomial confidence intervals -- Chi-square approximation for poisson confidence intervals -- Arrhenius model -- Sequential testing -- Tables.
Holdings
Item type Current library Call number Copy number Status Barcode
General lending MTU Bishopstown Library Lending 620.00452 (Browse shelf(Opens below)) 1 Available 00014195
Total holds: 0

Enhanced descriptions from Syndetics:

Statistical applications for quality and reliability engineering personnel are provided in this book. it requires no mathematical skills beyond algebra and elementary statistics methods. the book provides solutions to many common reliability applications, gives examples for every operation, and contains many of the statistical applications found on the ASQ Certified Reliability Engineer exam.

Bibliography: (page 89) and index.

Reliability definitions -- Availability -- Reliability bathtub curve -- Exponential distribution -- Estimating MTBF -- Censoring and MTBF calculations -- Reliability prediction -- Confidence intervals for MTBF -- System reliability -- Bayes' theorem application -- Beta distribution -- Nonparametric and related test designs -- Hazard function -- Wearout distribution -- Conditional probability of failures -- Weibull distribution -- Log-normal distribution -- Stress-strength interference -- Binomial confidence intervals -- Chi-square approximation for poisson confidence intervals -- Arrhenius model -- Sequential testing -- Tables.