Electron microscopy and analysis, 1987 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at UMIST, 8-9 September 1987 (EMAG 87) / edited by L.M. Brown.
Contributor(s): Brown, L. M
| Institute of Physics (Great Britain). Electron Microscopy and Analysis Group.
Material type: 
BookSeries: Institute of Physics conference series ; no. 90.Publisher: Bristol, England. Philadelphia : Institute of Physics, c1987Description: xv, 361 p. : ill. ; 25 cm. + hbk.ISBN: 0854981810.Subject(s): Electron spectroscopy -- Congresses | Electron microscopy -- CongressesDDC classification: 502.825 | Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| General lending | MTU Bishopstown Library Lending | 502.825 (Browse shelf(Opens below)) | 1 | Available | 00027929 |
Enhanced descriptions from Syndetics:
These proceedings focus on the physical basis & underlying theory of electron optics & analysis. The theme of the conference was advances in images & analysis with electrons & other focussed probes. Topics covered included conventional electron optics & analysis, secondary ion mass spectroscopy, scanning Auger spectroscopy, x-ray microscopy, acoustic microscopy & lithography.
Includes bibliographical references and indexes.
Auger spectroscopy -- Metal oxides-corrosion and catalysts -- Secondary ion mass spectrometry -- Instrumentation -- Diffraction techniques -- Beam-induced modifications -- Scanning electron microscopy -- High resolution electron microscopy -- Semiconductors and superconductors -- Alternative imaging techniques -- X-ray microanalysis.