Practical surface analysis / edited by D. Briggs and M. P. Seah.
Contributor(s): Briggs, D. (David)
| Seah, M. P.
Material type: 
BookPublisher: Chichester : Wiley, 1990-c1992Edition: 2nd ed.Description: 2 v. : ill. ; 24 cm.ISBN: 0471920819 ; 0471920827 .Subject(s): Surfaces (Technology) -- Analysis | Electron spectroscopyDDC classification: 530.417 | Item type | Current library | Call number | Copy number | Status | Barcode | |
|---|---|---|---|---|---|---|
| General lending | MTU Bishopstown Library Lending | 530.417 (Browse shelf(Opens below)) | 1 | Available | 00012384 | |
| General lending | MTU Bishopstown Library Lending | 530.417 (Browse shelf(Opens below)) | 1 | Available | 00012385 |
Enhanced descriptions from Syndetics:
The growth and diversification of surface analytical techniques began in the 1960s with the development of electron spectroscopy - first Auger electron spectroscopy (AES), closely followed by X-ray photo-electron spectroscopy (XPS or ESCA). Today these two complementary techniques still dominate the surface analysis scene.
Includes bibliographical references and indexes.
v. 1. Auger and X-ray photoelectron spectroscopy -- v. 2. Ion and neutral spectroscopy.