MTU Library Catalogue

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Instrumentation and measurement technology and applications / edited by Emil M. Petriu.

Contributor(s): Petriu, Emil.
Material type: materialTypeLabelBookSeries: IEEE technology update series: Publisher: New York : Institute of Electrical and Electronics Engineers, 1998Description: xx, 521 p. : ill. ; 29 cm. + hbk.ISBN: 0780342682 .Subject(s): Electronic instruments | Measurement | Optoelectronics | DetectorsDDC classification: 620.0044
Contents:
Part I: Technology -- Measurement theory and system characterization -- Metrology, standards and calibration -- Quantization and A/D conversion -- Basic measurements -- High frequency and dielectric measurements -- Electro-optic measurements -- Sensors and their interfaces -- Smart sensor integration technologies -- Data acquisition and computer based measurement systems -- Signal processing -- Image processing -- Part II: Applications -- Miscellaneous applications -- Integrated circuit testing -- Soft computing and virtual environment-based applications.
Holdings
Item type Current library Call number Copy number Status Barcode
General lending MTU Bishopstown Library Lending 620.0044 (Browse shelf(Opens below)) 1 Available 00076118
Total holds: 0

Enhanced descriptions from Syndetics:

Practical solutions to a range of instrumentation and measurement problems are presented in this volume. It offers practical design engineers with technology and applications developments within this area.

A collection of selected papers from recent IEEE conferences.

Includes bibliographical references and indexes.

Part I: Technology -- Measurement theory and system characterization -- Metrology, standards and calibration -- Quantization and A/D conversion -- Basic measurements -- High frequency and dielectric measurements -- Electro-optic measurements -- Sensors and their interfaces -- Smart sensor integration technologies -- Data acquisition and computer based measurement systems -- Signal processing -- Image processing -- Part II: Applications -- Miscellaneous applications -- Integrated circuit testing -- Soft computing and virtual environment-based applications.