https://libsearch.mtu.ie/cgi-bin/koha/opac-search.pl?q=ccl=an%3A36708&sort_by=relevance&format=rss 5 0 50 ISBN:0824778499 https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=11423 ]]> By Arabian, Jack,.
New York : Marcel Dekker, 1989 .
xxi, 589 p. : 24 cm..
0824778499

]]> Place hold on Computer integrated electronics manufacturing and testing /

]]> https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=11423 ISBN:0750624612 https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=17682 ]]> By Pain, Robin..
Oxford : Newnes, 1996 .
ix, 274 p. : , Includes index. 24 cm. +.
0750624612

]]> Place hold on Practical electronic fault finding and troubleshooting /

]]> https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=17682 ISBN:0333184009 https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=18188 ]]> By Simpson, A. (Arnold), 1925-.
London : MacMillan, 1976 .
vii, 172 p. : , With answers. 24 cm. +.
0333184009

]]> Place hold on Testing methods and reliability, electronics /

]]> https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=18188 ISBN:0273012681 https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=37290 ]]> By Loveday, George..
London : Pitman, 1980 .
[4], 212 p. : , With answers. Includes index. 25 cm +.
0273012681

]]> Place hold on Electronic testing and fault diagnosis /

]]> https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=37290 ISBN:0780360257 https://libsearch.mtu.ie/cgi-bin/koha/opac-detail.pl?biblionumber=44170 ]]> New York : IEEE Press, 2001 .
xxii, 372 p. : 26 cm. +.
0780360257

]]> Place hold on Accelerated stress testing handbook :

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