Search for 'su:"Failure time data analysis"'

The statistical analysis of failure time data /

]]> By Kalbfleisch, J. D..
New York : Wiley, 1980 .
xi, 321 p. : 24 cm. +.
0471055190

]]> Place hold on The statistical analysis of failure time data /

Reliability & life testing handbook. vol. 1 /

]]> By Kececioglu, Dimitri..
Englewood Cliffs, NJ : PTR Prentice Hall, 1993 .
v. <1 > : , Cover title: Reliability & life testing handbook. 24 cm..
0137723776

]]> Place hold on Reliability & life testing handbook.

Reliability & life testing handbook. Vol.2 /

]]> By Kececioglu, Dimitri..
EnglewoodCliffs, N.J. : Prentice-Hall, 1994 .
xli, 859 p. : 24 cm..
0137723695

]]> Place hold on Reliability & life testing handbook.

Statistical models and methods for lifetime data /

]]> By Lawless, J. F..
New York : Wiley, 1982 .
xi, 580 p. ; 24 cm. +.
0471085448

]]> Place hold on Statistical models and methods for lifetime data /

Analysis of failure and survival data /

]]> By Smith, Peter J.,.
Boca Raton : Chapman & Hall/CRC, 2002 .
254 p. : 24 cm. +.
1584880759 (pbk)

]]> Place hold on Analysis of failure and survival data /

Survival analysis using S : analysis of time-to-event data /

]]> By Tableman, Mara..
Boca Raton, Fla. : Chapman & Hall/CRC, 2004 .
xv, 260 p. : 25 cm. +.
1584884088 (pbk)

]]> Place hold on Survival analysis using S :

Accelerated testing : statistical models, test plans and data analyses /

]]> By Nelson, Wayne,.
New York : Wiley, 1990 .
xiv, 601 p. : 23 cm..
0471697362

]]> Place hold on Accelerated testing :

Investigation into the correct statistical distribution for oxide breakdown versus the oxide thickness used in integrated circuit manufacture. /

]]> By O'Driscoll, Eoin James..
2004 .
104p. (with appendices) : 30 cm. +.

]]> Place hold on Investigation into the correct statistical distribution for oxide breakdown versus the oxide thickness used in integrated circuit manufacture. /